Flash support: Add flash support for LPC54114 & LPC546XX #6198
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| int32_t ret = -1; | ||
| uint8_t buf[FSL_FEATURE_SYSCON_FLASH_PAGE_SIZE_BYTES]; | ||
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| if (address == 0) { // Check for Vector Table |
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How does this work with bootloader, or does not have any affect? (not sure what n represents)
From the code, n gets overwritten on line 81 (is it just reusing the variable? wouldn't it be more clear to have two separate ? n on the line 81 represents sector number, here on this line it is signature calculation?
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It is required by the ROM bootflow.
0x1C Vector checksum (set by tool vendors).
You are right, the variable is reused for a different purpose. If it is not clear we can create a different variable.
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You are right, the variable is reused for a different purpose. If it is not clear we can create a different variable.
Please do, should help clarify the intention of those 2 variables in this function.
The rest LGTM
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@0xc0170 . Anything else needed for this PR. |
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@0xc0170 . Anything else needed for this PR. |
Signed-off-by: Mahesh Mahadevan <[email protected]>
mmahadevan108
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@0xc0170 PR has been rebased and updated per review comments |
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/morph build |
Build : SUCCESSBuild number : 1385 Triggering tests/morph test |
Exporter Build : SUCCESSBuild number : 1039 |
Test : FAILUREBuild number : 1170 |
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@0xc0170 I don't think the TEST FAILURE is due to this PR. |
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/morph test |
Test : SUCCESSBuild number : 1185 |
Passed the flash tests
LPC54114:
mbedgt: test on hardware with target id: 105400001b4ee77600000000000000000000000097969905
mbedgt: test suite 'mbed-os-tests-mbed_hal-flash' .................................................... OK in 14.28 sec
test case: 'Flash - buffer alignment test' ................................................... OK in 0.14 sec
test case: 'Flash - clock and cache test' .................................................... OK in 0.10 sec
test case: 'Flash - erase sector' ............................................................ OK in 0.14 sec
test case: 'Flash - init' .................................................................... OK in 0.08 sec
test case: 'Flash - mapping alignment' ....................................................... OK in 0.05 sec
test case: 'Flash - program page' ............................................................ OK in 0.24 sec
mbedgt: test case summary: 6 passes, 0 failures
LPC564XX:
mbedgt: test on hardware with target id: 105600001984a78e00000000000000000000000097969905
mbedgt: test suite 'mbed-os-tests-mbed_hal-flash' .................................................... OK in 14.01 sec
test case: 'Flash - buffer alignment test' ................................................... OK in 0.14 sec
test case: 'Flash - clock and cache test' .................................................... OK in 0.06 sec
test case: 'Flash - erase sector' ............................................................ OK in 0.13 sec
test case: 'Flash - init' .................................................................... OK in 0.04 sec
test case: 'Flash - mapping alignment' ....................................................... OK in 0.05 sec
test case: 'Flash - program page' ............................................................ OK in 0.23 sec
mbedgt: test case summary: 6 passes, 0 failures