[SYCL][libdevice] Tests for half value type cast utils. #1301
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This PR is test for intel/llvm#6930 |
Signed-off-by: jinge90 <[email protected]>
Signed-off-by: jinge90 <[email protected]>
Signed-off-by: jinge90 <[email protected]>
Signed-off-by: jinge90 <[email protected]>
Signed-off-by: jinge90 <[email protected]>
Signed-off-by: jinge90 <[email protected]>
Signed-off-by: jinge90 <[email protected]>
Signed-off-by: jinge90 <[email protected]>
Signed-off-by: jinge90 <[email protected]>
Signed-off-by: jinge90 <[email protected]>
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| std::initializer_list<uint64_t> input_vals = { |
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Is this just a sanity check or detailed test?
The test is good as a sanity one.
For detailed test I would suggest to extend it by:
- all DP corner points: +/-zero, +/-max&min subnormals, +/-max&min normals, +/-infs, nans
- all HP expected output corner points: +/-zero, +/-max&min subnormals, +/-max&min normals
(some of them are already covered) -
- all possible exponent fields (with random mantissa)
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Hi, @akolesov-intel
This test is a lit test which is similar to sanity test. And I also added +0/-0, +/-max & min subnormals, +/- max & min normals, +/-infs
Thanks very much.
Signed-off-by: jinge90 <[email protected]>
Signed-off-by: jinge90 <[email protected]>
Signed-off-by: jinge90 <[email protected]>
…rted on CPU device Signed-off-by: jinge90 <[email protected]>
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Hi, @steffenlarsen and @intel/llvm-reviewers-runtime Thanks very much. |
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Hi, @steffenlarsen and @intel/llvm-reviewers-runtime |
Signed-off-by: jinge90 <[email protected]>
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Failures are unrelated. Linux Level-Zero failure: Windows OpenCL failure: |
Signed-off-by: jinge90 <[email protected]>
…est-suite#1301) Signed-off-by: jinge90 <[email protected]>
Signed-off-by: jinge90 [email protected]