You signed in with another tab or window. Reload to refresh your session.You signed out in another tab or window. Reload to refresh your session.You switched accounts on another tab or window. Reload to refresh your session.Dismiss alert
[SYCL][NFC] Avoid XPASS-es in some graph tests (#12421)
A couple of graph related tests were marked as `XFAIL`ed on OpenCL
backend and it works just fine for intel/llvm. At intel/llvm we launch
E2E tests for multiple targets in one LIT run, but there are some side
effects of that mechanism like treating `XFAIL` as `UNSUPPORTED`.
We have downstream testing environments where E2E tests are launched for
a single target. When those tests are launched on an OpenCL device
without graphs support, they do early exit with exit code zero which is
equivalent to `PASS` from LIT point of view. That turns into an `XPASS`
due to `XFAIL` in the test, causing our CI to report failures.
Changed `XFAIL` to `UNSUPPORTED`, which will work for all possible
environments, regardless of amount of targets for E2E tests and status
of graphs support on OpenCL devices used in testing.
0 commit comments