[SYCL][NFC] Avoid XPASS-es in some graph tests
#12421
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A couple of graph related tests were marked as `XFAIL`ed on OpenCL backend and it works just fine for intel/llvm. At intel/llvm we launch E2E tests for multiple targets in one LIT run, but there are some side effects of that mechanism like treating `XFAIL` as `UNSUPPORTED`. We have downstream testing environments where E2E tests are launched for a single target. When those tests are launched on an OpenCL device without graphs support, they do early exit with exit code zero which is equivalent to `PASS` from LIT point of view. That turns into an `XPASS` due to `XFAIL` in the test, causing our CI to report failures. Changed `XFAIL` to `UNSUPPORTED`, which will work for all possible environments, regardless of amount of targets for E2E tests and status of graphs support on OpenCL devices used in testing.
AlexeySachkov
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AlexeySachkov
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EwanC
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Jan 17, 2024
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@intel/llvm-gatekeepers I think this can be merged |
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A couple of graph related tests were marked as
XFAILed on OpenCL backend and it works just fine for intel/llvm. At intel/llvm we launch E2E tests for multiple targets in one LIT run, but there are some side effects of that mechanism like treatingXFAILasUNSUPPORTED.We have downstream testing environments where E2E tests are launched for a single target. When those tests are launched on an OpenCL device without graphs support, they do early exit with exit code zero which is equivalent to
PASSfrom LIT point of view. That turns into anXPASSdue toXFAILin the test, causing our CI to report failures.Changed
XFAILtoUNSUPPORTED, which will work for all possible environments, regardless of amount of targets for E2E tests and status of graphs support on OpenCL devices used in testing.