-
Notifications
You must be signed in to change notification settings - Fork 787
[NFC][SYCL] Stabilize sub_group LIT tests #2253
New issue
Have a question about this project? Sign up for a free GitHub account to open an issue and contact its maintainers and the community.
By clicking “Sign up for GitHub”, you agree to our terms of service and privacy statement. We’ll occasionally send you account related emails.
Already on GitHub? Sign in to your account
Conversation
- Fixed OCL_ICD_FILENAMES capturing to LIT environment. - Disable sub_group tests which fail on some ISAs on OpenCL CPU. - Change local and global workgroup sizes to make them dividend of all possible sub_group sizes. That will fix test failures in the last sub_group of local group. - Remove use of deprecated shuffle methods. - Fixed tests where sub_group local ID exceed sub_group size.
Isn't it important to test that the final sub-group in each work-group still supports these operations? The final sub-group will require some special handling (because in some cases the results of certain shuffles are undefined) but I don't think we should only test evenly divisible cases. |
In fact it means that we are testing test itself and OpenCL RT because the difference between divisible and non-divisible case is in OpenCL RT and test but not in SYCL RT. So I removed this case |
I'm not sure I understand. Are you saying that because the SYCL compiler just forwards these functions to |
Yes, you are right. This is what I was trying to say. |
There was a problem hiding this comment.
Choose a reason for hiding this comment
The reason will be displayed to describe this comment to others. Learn more.
The changes LGTM
Ok, got it. Thanks for the explanation. |
add low-power events experimental extension spec
of all possible sub_group sizes. That will fix test failures
in the last sub_group of local group.