[android] Fix IRGen/condfail.sil test for Android ARMv7/AArch64. #23580
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compnerd
reviewed
Mar 27, 2019
For AArch64, the fix is duplicating the arm64 lines, since those are not taken when testing Android/Linux which use AArch64 as the architecture. For ARMv7, the change is supporting both trap and .inst 0xe7ffdefe. According to llvm/lib/Target/ARM/ARMAsmPrinter.cpp, non-Darwin binutils do not support the mnemonic trap, so an .inst is emitted instead. The same instruction has to be used in both places, though. For both architectures add the Android version of APP/NO_APP, which uses @-symbols or // instead of ##.
drodriguez
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Modified to have different Also remove the variable for the trap instruction. It doesn’t give us a lot more safety, and |
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@swift-ci please test and merge |
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For AArch64, the fix is duplicating the arm64 lines, since those are not
taken when testing Android/Linux which use AArch64 as the architecture.
For ARMv7, the change is supporting both trap and .inst 0xe7ffdefe.
According to llvm/lib/Target/ARM/ARMAsmPrinter.cpp, non-Darwin binutils
do not support the mnemonic trap, so an .inst is emitted instead. The
same instruction has to be used in both places, though.
For both architectures add the Android version of APP/NO_APP, which uses
@-symbols instead of ##.