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51 changes: 51 additions & 0 deletions TESTS/mbed_hal/critical_section/critical_section_test.h
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/* mbed Microcontroller Library
* Copyright (c) 2018 ARM Limited
*
* Licensed under the Apache License, Version 2.0 (the "License");
* you may not use this file except in compliance with the License.
* You may obtain a copy of the License at
*
* http://www.apache.org/licenses/LICENSE-2.0
*
* Unless required by applicable law or agreed to in writing, software
* distributed under the License is distributed on an "AS IS" BASIS,
* WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
* See the License for the specific language governing permissions and
* limitations under the License.
*/

/** \addtogroup hal_critical_tests
* @{
*/

#ifndef MBED_CRITICAL_SECTION_TEST_H
#define MBED_CRITICAL_SECTION_TEST_H

/** Template for HAL critical section tests
*
* Test critical section
* Given a critical section HAL mechanism
* When before critical section
* Then interrupts are enabled
* When inside critical section
* Then interrupts are disabled
* When after critical section
* Then interrupts are enabled again
*
* Test critical section - nested lock
* Given a critical section HAL mechanism
* When before critical section
* Then interrupts are enabled
* When inside nested critical section
* Then interrupts are disabled
* When after nested critical section
* Then interrupts are enabled again
*
*/
template <int N>
void test_critical_section();


/**@}*/

#endif // MBED_CRITICAL_SECTION_TEST_H
84 changes: 84 additions & 0 deletions TESTS/mbed_hal/critical_section/main.cpp
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/* mbed Microcontroller Library
* Copyright (c) 2018 ARM Limited
*
* Licensed under the Apache License, Version 2.0 (the "License");
* you may not use this file except in compliance with the License.
* You may obtain a copy of the License at
*
* http://www.apache.org/licenses/LICENSE-2.0
*
* Unless required by applicable law or agreed to in writing, software
* distributed under the License is distributed on an "AS IS" BASIS,
* WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
* See the License for the specific language governing permissions and
* limitations under the License.
*/
#include "critical_section_test.h"
#include "hal/critical_section_api.h"
#include "utest/utest.h"
#include "unity/unity.h"
#include "greentea-client/test_env.h"
#include "mbed.h"
#include "cmsis.h"
#ifdef TARGET_NRF5 // for all NRF5x targets
#include "nrf_nvic.h" // for __NRF_NVIC_APP_IRQS_0 / __NRF_NVIC_APP_IRQS_1
#endif

using utest::v1::Case;

bool test_are_interrupts_enabled(void)
{
// NRF5x targets don't disable interrupts when in critical section, instead they mask application interrupts this is due to BLE stack
// (BLE to be operational requires some interrupts to be always enabled)
#ifdef TARGET_NRF52_DK
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wasn't there somewhere a request for having function to check if interrupts are enabled? Or even an implementation?

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@maciejbocianski maciejbocianski Jan 22, 2018

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indeed, there is function hal_in_critical_section(), but it would be nice to verify API functions by something form outside critical section API. us_ticker could be used to check interrupts but unfortunately it utilises core_util_critical_section_ (which also call HAL critical API ) and it brakes the test. Generly we should always use platform core_util_critical_section not HAL, in particular we cannot use both in the same time

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I was concerned about the portability (how this function can grow in time).

Looks fine to test this here.

// check if APP interrupts are masked for NRF52_DK board
return (((NVIC->ISER[0] & __NRF_NVIC_APP_IRQS_0) != 0) || ((NVIC->ISER[1] & __NRF_NVIC_APP_IRQS_1) != 0));
#elif TARGET_NRF5
// check if APP interrupts are masked for other NRF5 boards
return ((NVIC->ISER[0] & __NRF_NVIC_APP_IRQS_0) != 0);
#else
#if defined(__CORTEX_A9)
return ((__get_CPSR() & 0x80) == 0);
#else
return ((__get_PRIMASK() & 0x1) == 0);
#endif
#endif
}


template<int N>
void test_critical_section()
{
TEST_ASSERT_FALSE(hal_in_critical_section());
TEST_ASSERT_TRUE(test_are_interrupts_enabled());

for (int i = 0; i < N; i++) {
hal_critical_section_enter();
TEST_ASSERT_TRUE(hal_in_critical_section());
TEST_ASSERT_FALSE(test_are_interrupts_enabled());
}

// assumed to be called once (according API)
hal_critical_section_exit();

TEST_ASSERT_FALSE(hal_in_critical_section());
TEST_ASSERT_TRUE(test_are_interrupts_enabled());
}

Case cases[] = {
Case("Test critical section single lock", test_critical_section<1>),
Case("Test critical section nested lock", test_critical_section<10>)
};

utest::v1::status_t greentea_test_setup(const size_t number_of_cases)
{
GREENTEA_SETUP(10, "timing_drift_auto");
return utest::v1::greentea_test_setup_handler(number_of_cases);
}

utest::v1::Specification specification(greentea_test_setup, cases);

int main()
{
return !utest::v1::Harness::run(specification);
}